Paper Title: Multiple SSDs Reliability and Quality Verification with New QRDT System

Paper Abstract: To overcome reliability coverage issues, we propose an advanced performance of various SSDs and quality verification system based on JEDEC, SNIA, uFlip and NVMe standards. The result is QRDT(Quality and Reliability Demonstration Test) System that satisfies these goals. The application and quality requirements of SSD become diverse, but the reliability evaluation focuses on only narrow test conditions using the predefined workload, which does not cover the full range of requirements. The QRDT includes the following verification test suite; Steady State Quality Test, Dirty State Quality Test, Workload Dependency Test, I/O Dependent Management Test, NVMe Verification Test, and Long Tail Latency Test. The Long Tail Latency Test could find the variations in each SSD not visible from the other test suite. The generation points of the tail latency showed the distribution of two nines to six nines for seven application groups. In addition, the SSDs with good tail latency characteristics also had good speed-recovery characteristics the Dirty State Quality Test. The speed-recovery variation between case of best and worst was about 30% when we examined the Dirty State Quality Test results.

Paper Author: Kiseog Kim, Head of R&D, QRT / Research & Development

Author Bio: Kiseog Kim is Vice President in QRT and head of R&D center. He is responsible for developing new technology for reliability evaluations on various semiconductors and especially effective reliability evaluation system on various application of SSD. Before joining to QRT in 2018, he had developed 3D as well as 2D NAND Flash memory products for 22 years in Hynix. He holds 30 issued US patents on flash memory. In 1996, he got Ph.D in Yeonsei University, Korea.