Paper Title: End-to-End NVMe Debugging

Paper Abstract: The presentation will explore ways to improve your ability to find and troubleshoot errors during validation and testing. We will provide real-world examples using data/error "triggers" from OakGate Test Appliances and the Teledyne LeCroy Summit series Protocol Analyzers. The discussion will review the debug process flow for capturing the needed data to define a trigger, how to set up recording options to stop the analyzer on the trigger and how to analyze the captured trace to debug and root cause the error.

Paper Author: Dave Obert, US Sales Development Manager, Teledyne LeCroy

Author Bio: Mr. Obert is currently a sales development manager supporting Teledyne LeCroy's US sales team. With a deep knowledge of NVMe protocol, SSD storage and SSD research and development processes, he provides authoritative subject matter expertise for leading-edge test and validation products throughout the consultative sales process. Before Teledyne LeCroy, Mr. Obert was employed with HPE for twenty-one years working in a number of marketing, sales, and business planning roles.