Paper Title: The State of NVMe Interoperability

Paper Abstract: NVMe has become synonymous with high-performance storage with widespread adoption in client, cloud, and enterprise applications. Although initially developed for direct-attached PCIe SSDs, NVMe is now widely used in both direct-attached and fabric attached applications. This presentation provides an overview of the latest NVMe technologies, summarizes the NVMe standards roadmap, and describes new NVMe standardization initiatives.

Paper Author: Peter Onufryk, Fellow Data Center Solutions BU, Intel
David Woolf, Sr Engineer Datacenter Technology, UNH-IOL

Author Bio: Peter Onufryk has been very active in NVMe standardization as an NVMe Board Member and NVMe Management Workgroup Chair. He has been a featured speaker at many events on NVMe and NVMe-MI, including Flash Memory Summit. He holds over 40 patents in interfaces and communications and has written several published articles. He was previously Director of Engineering at Integrated Device Technology (IDT) and a research staff member at AT&T Bell Labs. He earned a PhD in electrical and computer engineering from Rutgers University and an MSEE from Purdue University.

Author 2 Bio: David Woolf is Senior Engineer, Datacenter Technologies at the University of New Hampshire InterOperability Laboratory (UNH-IOL), where he coordinates the NVMe integrators list and plugfests. He has developed dozens of industry-reviewed test procedures and implementations as part of the team that has grown the UNH-IOL into a world-class center for interoperability and conformance testing. David has also helped organize many industry interoperability test events at both at the UNH-IOL facility and off-site locations. He has also presented webinars on NVMe and presented on NVMe testing and interoperability at many conferences including Flash Memory Summit and Open Compute Summit. He earned a BSEE at the University of New Hampshire.