Paper Title: Cross Temperature of NAND Flash Storage in Automotive Applications

Paper Abstract: The Automotive OEM's requirement for Environmental conditions and testing for electrical and electronic equipment, we observe the effects of Temperature step test, Temperature cycling test and life test toward 2D MLC and 3D TLC. It's also a challenge dealing with cross temp. from -40C to +85C (125C temp. range) which requires FW calibration with NAND thermal sensor for automotive applications.

Paper Author: Crystal Chang, Senior Manager, ATP Electronics

Author Bio: Crystal Chang, Senior Manager of Product Management, ATP Electronics, Inc. Crystal leads ATP Automotive Task Force to provide high reliability & quality products qualified by automotive standards (AEC-Q100, AEC-Q104) to meet automotive customers' requirements.