Paper Title: How to Detect and Handle SD and SSD Media Failures

Paper Abstract: Managed NAND media (SD and SSD) has failure modes which can be devastating to embedded systems. Even error-correcting codes and CRC codes cannot eliminate all of them. Some of the most difficult to detect or correct include partially programmed pages, read disturb errors (known metaphorically as "bit rot"), metadata corruption, and stale data. The use of sequence numbers and a validation technique called Merkle Trees can help.

Paper Author: Thom Denholm, Technical Product Manager, Datalight

Author Bio: Thom Denholm is a Technical Product Manager at Datalight, a leading provider of embedded file systems. He works on product planning and worldwide marketing of the software products, provides pre-sales support and technical assistance, and tains partners, channel participants, and customers. He is a frequent blogger on embedded systems and also does webinars and demonstration videos. He has over 20 years experience in the embedded space, combining a strong focus on operating system and file system internals with a knowledge of modern flash devices. He holds a BS in Mathematics and Computer Science from Gonzaga University (Spokane, WA). He has spoken at many events, including past Flash Memory Summits.