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3:40-6:00 PM
SSDS-102-1: Enterprise SSDs (SSDs Track)
Paper Title: Overcoming the Reductions in NAND Endurance Ratings

Paper Abstract: NAND hasn't exactly followed the-better-faster-cheaper mantra. Cheaper has certainly come to fruition. But, as the industry has moved to lower geometries and to higher bits-per-cell, raw NAND endurance (Program-Erase Cycles) and error rates (Raw Bit Error Rates) have suffered. SSD vendors and Flash controller developers have to advance existing methods and devise new schemes for delivering overall drive endurance and data reliability to users. This discussion provides an overview of these methodologies.

Paper Author: JB Baker, VP Marketing, ScaleFlux

Author Bio: Mr. JB Baker is a twenty year storage industry veteran with a proven track record in driving the market introduction and strategic planning of enterprise SSDs. JB joined ScaleFlux in November 2018 and serves as Senior Director of Product Management. Prior, he held influential roles at Intel, LSI, and Seagate. Mr. Baker holds a BA from Harvard University and an MBA from Cornell University.