Paper Title: Intra-disk RAID for Extreme Data Recovery

Paper Abstract: To ensure data protection in SSDs, manufacturers employ both complex error correction codes (ECC) and second level error correction, such as intra-disk RAID. A model of the reliability of intra-disk RAID is applied to TLC NAND-based SSDs. Parametric analysis of the uncorrectable bit error rate (UBER) for SSDs using RAID-5 and RAID-6 shows the conditions required to achieve the desired reliability level for enterprise SSDs. This investigation can be used to assess whether the results of an extreme recovery of a failed device using intra-disk RAID are likely to be cost-effective for the customer.

Paper Author: Cristian Zambelli, Assistant Professsor, University of Ferrara (Italy)

Author Bio: Cristian Zambelli received the M.Sc. and the Ph.D. degrees (with honors) in electronic engineering from the University of Ferrara, Ferrara, Italy, in 2008 and 2012, respectively. Since 2015, he holds an Assistant Professor position with the same institution. His current research interests include the electrical characterization, physics, and reliability modeling of different nonvolatile memories such as NAND/NOR Flash, Phase Change Memories, Nano-MEMS memories, Resistive RAM (RRAM), and Magnetic RAM. He is also interested in the evaluation of the Solid State Drives reliability/performance trade-offs exposed by the integrated memory technology.