Paper Title: Using an Analytics Pipeline to Monitor NAND Health Data in the Field

Paper Abstract: Nowadays most flash-based storage systems generate huge amounts of data about how the flash memory is behaving. Using an analytics pipeline, one can perform an entire series of operations on the logs and monitor the health of the flash over time. An example shows how a field organization used data from customer sites to extract daily insights on what is happening with the flash memory in its products.

Paper Author: Behzad Amiri, Senior Nand Engineer, Pure Storage

Author Bio: Behzad Amiri is a Senior Engineer with Pure Storage, a leading developer of flash arrays. He is a member of the flash reliability and channel architecture team at Pure. An expert on error-correction coding, he has 16 published articles in academic journals such as the IEEE Transactions on Communications and the IEEE Transactions on Information Theory. He has also authored presentations at such prestigious conferences as the IEEE Global Communications Conference (Globecom) and the IEEE International Symposium on Information Theory (ISIT). He earned a PhD in electrical engineering from UCLA. He holds a patent on flash read voltage thresholds.