Paper Title: Testing Dual-Port NVMe SSDs

Paper Abstract: Dual-port NVMe SSDs are gaining significant traction in the enterprise market. With features such as multipath and the ability to connect to two hosts simultaneously, the devices are very useful in networked enterprise storage systems. A key issue in extending their use is that such devices must be tested for their reliability and performance on automated test equipment. Test engineers must develop typical workloads that will stress the dual-port features. This requires a more complex test setup than is needed for single-port devices. Test coverage is critical, as are possible effects on device performance from the test system architecture.

Paper Author: Sneha Nadig, R&D Applications Engineer, Advantest

Author Bio: Sneha Nadig is Product Applications Engineer at Advantest, where she is in charge of product engineering for a multi-protocol system to test multi-lane high performance SSDs. She has developed customized application test programs and implemented vendor-unique commands for testing NVMe, SATA, and SAS SSDs. She holds an MS in Engineering Management from Santa Clara University, an MSEE from ESIEE Paris, France, and a Bachelor of Engineering in Electronics and Communication from Gujarat University, India.