Paper Title: Solving functional safety challenges in automotive with NOR Flash Memory

Paper Abstract: Autonomous vehicles are ushering in a new revolution for transportation systems. These vehicles rely on advanced electronic systems to sense the environment, make decisions and control the vehicle. As the level of autonomy increases, the burden of responsibility for passenger safety is transferred from humans to electronics. Therefore, these electronic systems need to ensure functional safety in compliance with ISO 26262 standards. Flash memory is one critical component in these electronic systems. Flash is used to store the complex algorithms and data that power the autonomous operations. Therefore, it is critical to ensure the reliability and functional safety of the Flash memory device throughout the 20-year lifespan of the vehicle. Flash devices must provide functions to diagnose device health, correct errors, detect failures early, and protect data from unintentional changes. In addition, they must meet ASIL-B/D ISO 26262 functional safety standards and provide high reliability in harsh environments. This session will focus on how to design critical ASIL-B and ASIL-D automotive systems using the functional safety features of Flash memory solutions.

Paper Author: Sandeep Krishnegowda, Marketing Director, Flash Business Unit, Cypress Semiconductor

Author Bio: Sandeep Krishnegowda is marketing director of the Flash Business Unit at Cypress Semiconductor Corp. He has worked in Cypress’ memory products division for more than ten years in a variety of engineering, management and marketing roles. He earned an MS in Electronics and Communication from Rensselaer Polytechnic Institute and a BE in Electronics and Communication from Visvesvaraya Technological University.