Paper Title: Using Functional Monitors to Ensure Chiplet Integrity

Paper Abstract: Chip developers must ensure the integrity and trustworthiness of all chiplets used in the creation of a multi-die IC. The security tokens should be generated dynamically during operation, not hard coded into the chiplets. Using functional monitors to build a key based on transactions ensures the creation of an accurate token. The token could even differ for different integrations of the same chiplet, so application dependence ensures the use of the correct software build. This methodology deploys a zero trust approach even within an SoC, where the use of off-the shelf chiplets produces a major security challenge.

Paper Author: Lee Harrison, Marketing Director, Siemens Digital Industries Software

Author Bio: Lee Harrison is Director Product Marketing at Siemens, where he works on safety and security products focused on the automotive industry. He has over 20 years experience with DFT products and has helped deliver high-quality DFT solutions. He has hosted the Security by Design podcast series discussing safety and security in the IC industry and has presented at industry conferences such as DAC, ITC, and DATE. He earned a BEng in MicroElectronic Engineering from Brunel University London.