Paper Title: Chiplet Testing Basics

Paper Abstract: Test and repair play a major role in chiplet-based systems, since individual chiplets, the interconnects between them, and the final integrated system must all be of known-good quality and high yield levels. So test and repair can become a critical cost factor if the overall design includes many different chiplets. With the growth in high-speed communication between chiplets, such as UCIe for logic-to-logic chiplets, and HBM for memory to logic chiplets, designers must be aware of test, monitoring, and repair demands in all lifecycle phases. They must embed resources for design-for-test, signal monitors, and redundancy elements everywhere. Silicon lifecycle management for chiplet-based systems is also essential. It includes the automated solutions needed to operate test and reliability sets, apply them, and perform data analytics on the results.

Paper Author: Yervant Zorian, Chief Architect/Fellow, Synopsys Inc

Author Bio: Yervant Zorian is Fellow/Chief Architect at Synopsys, where he focuses on technology roadmaps. He has over 30 years of experience in test technology including stints at Virage Logic, LogicVision, and Bell Labs. A world-leading authority on self-repairing systems, he has been the President of the IEEE Test Technology Technical Council, chair of the IEEE 1500 Standardization Working Group (Design for Testability of Embedded Cores), Editor-in-Chief of IEEE Design and Test of Computers magazine, Vice-President of IEEE Computer Society, General Chair of the 50th Annual Design Automation Conference (DAC) and General Chair of the 50th Annual International Test Conference. He holds 45 patents, has authored five books, and has published over 400 refereed papers and received many best paper awards. He is a Fellow of the IEEE, the recipient of the Industrial Pioneer Award for contributions to built-in self-test (BIST), and the recipient of IEEE’s Distinguished Services Award and Meritorious Award. He earned a PhD in electrical engineering from McGill University (Canada).